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News
Caterpillar FieldAI Collaboration: Advancing Physical AI in Construction and Mining - News and Statistics
6+ day, 20+ hour ago (185+ words) Caterpillar has announced a new partnership with FieldAI aimed at pushing forward physical AI, autonomy, and robotics in both jobsite and manufacturing settings. The objective is to support sectors grappling with workforce shortages and heightened efficiency demands, enabling safer and…...
How Packet-Based NPU Design Tackles Memory-Bound LLM/VLM Workloads at the Edge - News and Statistics
4+ week, 2+ day ago (798+ words) IndexBox Search across reports, market insights, and blog stories. Expedera Origin NPU: Packet-Based Architecture for LLM/VLM Edge Workloads Semiconductor Engineering readers may already be familiar with the core idea behind Expedera's Origin NPU IP architecture: processing data in packets…...
SLB and Qualcomm Technologies Partner on Edge AI for Energy Operations - News and Statistics
2+ mon, 4+ week ago (447+ words) IndexBox Search across reports, market insights, and blog stories. SLB and Qualcomm Technologies Partner to Develop Edge AI Solutions for Energy Industry Global energy technology company SLB has signed a memorandum of understanding with Qualcomm Technologies to develop edge AI…...
AI in Semiconductor Defect Inspection: Scaling Challenges and Breakthroughs in 2026 - News and Statistics
3+ mon, 3+ day ago (283+ words) In automated defect classification, Han said deep learning is transforming the process by using convolutional neural networks to automatically learn complex defect characteristics from image data, enabling faster classification of particles, scratches, voids, and pattern collapses, reducing manual review effort....
Inference Scaling for Large Language Models: Micron and Argonne Study on Reasoning Workloads - News and Statistics
3+ mon, 2+ week ago (357+ words) Micron and Argonne Analyze Inference Scaling for Reasoning-Focused LLMs IndexBox Search across reports, market insights, and blog stories. Micron and Argonne Analyze Inference Scaling for Reasoning-Focused LLMs Researchers from Micron Technology and Argonne National Laboratory have published a technical paper…...
Averroes AI Builder: Operationalizing Deep Learning for Semiconductor Inspection - News and Statistics
3+ mon, 3+ week ago (880+ words) Averroes AI Builder: Operationalizing Deep Learning for Semiconductor Inspection IndexBox Search across reports, market insights, and blog stories. Averroes AI Builder: Operationalizing Deep Learning for Semiconductor Inspection For years, semiconductor inspection has been hampered by scalability issues. Inspection teams are…...
Balancing Model Size vs Computational Cost in Atomistic Simulations | Synopsys QuantumATK - News and Statistics
3+ mon, 3+ week ago (210+ words) A new article from Synopsys QuantumATK explores the enduring challenge in computer simulations: balancing model size against computational cost. Larger models can capture more realistic behavior, but they require significantly more time to run, forcing engineers and scientists to constantly…...
Why Not All MLPE Systems Are the Same: Architecture, Performance, and Long-Term Value - News and Statistics
3+ mon, 3+ week ago (365+ words) IndexBox Search across reports, market insights, and blog stories. Avoid These Critical MLPE Mistakes in Commercial Solar Installations Facchini draws a distinction between fully integrated platforms and systems assembled from components not originally designed to work together. While both types…...
Evaluating RISC-V Vector Processors: GCC vs. LLVM Autovectorization Benchmarks (May 2026) - News and Statistics
3+ mon, 3+ week ago (325+ words) IndexBox Search across reports, market insights, and blog stories. RISC-V Vector Processors Performance Assessment: Compiler Support and Hardware Capabilities A recent technical paper has assessed the performance of RISC-V vector processors, focusing on compiler support and hardware capabilities. The study,…...
MorphOPC: Neural Morphological Operations for Enhanced Optical Proximity Correction | 2026 - News and Statistics
3+ mon, 3+ week ago (233+ words) IndexBox Search across reports, market insights, and blog stories. MorphOPC: A New Method for Improving Mask Optimization in Semiconductor Manufacturing A new technical paper introduces a method called MorphOPC, which aims to improve mask optimization in semiconductor manufacturing. The research…...